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Elucidating and Mitigating Degradation Processes in Perovskite Light-Emitting Diodes
Univ Cambridge, Cavendish Lab, Dept Phys, JJ Thomson Ave, Cambridge CB3 0HE, England..
Univ Cambridge, Cavendish Lab, Dept Phys, JJ Thomson Ave, Cambridge CB3 0HE, England.;UCL, Inst Mat Discovery, Torrington Pl, London WC1E 7JE, England..ORCID iD: 0000-0002-9430-6371
Univ Cambridge, Dept Mat Sci & Met, 27 Charles Babbage Rd, Cambridge CB3 0FS, England..
Univ Cambridge, Cavendish Lab, Dept Phys, JJ Thomson Ave, Cambridge CB3 0HE, England..
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2020 (English)In: Advanced Energy Materials, ISSN 1614-6832, E-ISSN 1614-6840, Vol. 10, no 48, article id 2002676Article in journal (Refereed) Published
Abstract [en]

Halide perovskites have attracted substantial interest for their potential as disruptive display and lighting technologies. However, perovskite light-emitting diodes (PeLEDs) are still hindered by poor operational stability. A fundamental understanding of the degradation processes is lacking but will be key to mitigating these pathways. Here, a combination of in operando and ex situ measurements to monitor the performance degradation of (Cs(0.06)FA(0.79)MA(0.15))Pb(I0.85Br0.15)(3) PeLEDs over time is used. Through device, nanoscale cross-sectional chemical mapping, and optical spectroscopy measurements, it is revealed that the degraded performance arises from an irreversible accumulation of bromide content at one interface, which leads to barriers to injection of charge carriers and thus increased nonradiative recombination. This ionic segregation is impeded by passivating the perovskite films with potassium halides, which immobilizes the excess halide species. The passivated PeLEDs show enhanced external quantum efficiency (EQE) from 0.5% to 4.5% and, importantly, show significantly enhanced stability, with minimal performance roll-off even at high current densities (>200 mA cm(-2)). The decay half-life for the devices under continuous operation at peak EQE increases from <1 to approximate to 15 h through passivation, and approximate to 200 h under pulsed operation. The results provide generalized insight into degradation pathways in PeLEDs and highlight routes to overcome these challenges.

Place, publisher, year, edition, pages
WILEY-V C H VERLAG GMBH , 2020. Vol. 10, no 48, article id 2002676
Keywords [en]
degradation, halide perovskites, ion migration, light‐, emitting diodes, passivation
National Category
Condensed Matter Physics
Identifiers
URN: urn:nbn:se:uu:diva-438942DOI: 10.1002/aenm.202002676ISI: 000589517700001OAI: oai:DiVA.org:uu-438942DiVA, id: diva2:1540553
Funder
EU, Horizon 2020, 730872Swedish Research Council, VR 2018-04125Swedish Research Council, 2018-06465Swedish Research Council, 2018-04330Swedish Foundation for Strategic Research, RMA15-0130Swedish Energy Agency, P43549-1Available from: 2021-03-29 Created: 2021-03-29 Last updated: 2024-06-04Bibliographically approved

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Abdi-Jalebi, MojtabaMan, GabrielCappel, Ute B.Rensmo, Håkan
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