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Local low rank denoising for enhanced atomic resolution imaging
Uppsala universitet, Teknisk-naturvetenskapliga vetenskapsområdet, Fysiska sektionen, Institutionen för fysik och astronomi, Materialteori.ORCID-id: 0000-0002-6550-0087
Oak Ridge National Laboratory, Center for Nanophase Materials Sciences, Oak Ridge, TN 37831, USA.
Oak Ridge National Laboratory, Materials Sciences and Technology Division, Oak Ridge, TN 37831, USA.
Oak Ridge National Laboratory, Materials Sciences and Technology Division, Oak Ridge, TN 37831, USA.
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2018 (Engelska)Ingår i: Ultramicroscopy, ISSN 0304-3991, E-ISSN 1879-2723, Vol. 187, s. 34-42Artikel i tidskrift (Refereegranskat) Published
Abstract [en]

Atomic resolution imaging and spectroscopy suffers from inherently low signal to noise ratios often prohibiting the interpretation of single pixels or spectra. We introduce local low rank (LLR) denoising as tool for efficient noise removal in scanning transmission electron microscopy (STEM) images and electron energy-loss (EEL) spectrum images. LLR denoising utilizes tensor decomposition techniques, in particular the multilinear singular value decomposition (MLSVD), to achieve a denoising in a general setting largely independent of the signal features and data dimension, by assuming that the signal of interest is of low rank in segments of appropriately chosen size. When applied to STEM images of graphene, LLR denoising suppresses statistical noise while retaining fine image features such as scan row-wise distortions, possibly related to rippling of the graphene sheet and consequent motion of atoms. When applied to EEL spectra, LLR denoising reveals fine structures distinguishing different lattice sites in the spinel system CoFe2O4.

Ort, förlag, år, upplaga, sidor
Elsevier, 2018. Vol. 187, s. 34-42
Nationell ämneskategori
Atom- och molekylfysik och optik
Identifikatorer
URN: urn:nbn:se:uu:diva-348246DOI: 10.1016/j.ultramic.2018.01.012ISI: 000428131200005OAI: oai:DiVA.org:uu-348246DiVA, id: diva2:1196957
Tillgänglig från: 2018-04-11 Skapad: 2018-04-11 Senast uppdaterad: 2018-06-04Bibliografiskt granskad
Ingår i avhandling
1. Signal Processing Tools for Electron Microscopy
Öppna denna publikation i ny flik eller fönster >>Signal Processing Tools for Electron Microscopy
2018 (Engelska)Doktorsavhandling, sammanläggning (Övrigt vetenskapligt)
Abstract [en]

The detection of weak signals in noisy data is a problem which occurs across various disciplines. Here, the signal of interest is the spectral signature of the electron magnetic chiral dichroism (EMCD) effect. In principle, EMCD allows for the measurement of local magnetic structures in the electron microscope, its spatial resolution, versatility and low hardware requirements giving it an eminent position among competing measurement techniques. However, experimental shortcomings as well as intrinsically low signal to noise ratio render its measurement challenging to the present day.   

This thesis explores how posterior data processing may aid the analysis of various data from the electron microscope. Following a brief introduction to different signals arising in the microscope and a yet briefer survey of the state of the art of EMCD measurements, noise removal strategies are presented. Afterwards, gears are shifted to discuss the separation of mixed signals into their physically meaningful source components based on their assumed mathematical characteristics, so called blind source separation (BSS).    

A data processing workflow for detecting weak signals in noisy spectra is derived from these considerations, ultimately culminating in several demonstrations of the extraction of EMCD signals. While the focus of the thesis does lie on data processing strategies for EMCD detection, the approaches presented here are similarly applicable in other situations. Related topics such as the general analysis of hyperspectral images using BSS methods or the fast analysis of large data sets are also discussed.

Ort, förlag, år, upplaga, sidor
Uppsala: Acta Universitatis Upsaliensis, 2018. s. 60
Serie
Digital Comprehensive Summaries of Uppsala Dissertations from the Faculty of Science and Technology, ISSN 1651-6214 ; 1672
Nationell ämneskategori
Fysik Datavetenskap (datalogi) Annan matematik
Identifikatorer
urn:nbn:se:uu:diva-348264 (URN)978-91-513-0345-1 (ISBN)
Disputation
2018-06-12, Å2001, Ångströmlaboratoriet, Lägerhyddsvägen 1, Uppsala, 09:00 (Engelska)
Opponent
Handledare
Tillgänglig från: 2018-05-18 Skapad: 2018-04-11 Senast uppdaterad: 2018-10-08

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Av författaren/redaktören
Spiegelberg, JakobRusz, Ján
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Materialteori
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Ultramicroscopy
Atom- och molekylfysik och optik

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Totalt: 163 träffar
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