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A Cryo-FIB Lift-Out Procedure for Cryo-TEM Sample Preparation at Soft-HardMatter Interfaces
Uppsala University, Disciplinary Domain of Science and Technology, Technology, Department of Engineering Sciences, Experimental Physics.
2015 (English)In: Microscopy and Microanalysis, ISSN 1431-9276, E-ISSN 1435-8115, Vol. 21, 2315-2316 p.Article in journal, Meeting abstract (Other academic) Published
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2015. Vol. 21, 2315-2316 p.
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Natural Sciences Engineering and Technology
URN: urn:nbn:se:uu:diva-285511DOI: 10.1017/S1431927615012350OAI: diva2:921182
Available from: 2016-04-19 Created: 2016-04-19 Last updated: 2016-07-27Bibliographically approved

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Leifer, Klaus
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