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The ion microscope as a tool for quantitative measurements in the extreme ultraviolet
Umeå University, Faculty of Science and Technology, Department of Physics. Max-Planck-Institut für Quantenoptik, Garching, Germany.
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2016 (English)In: Scientific Reports, ISSN 2045-2322, E-ISSN 2045-2322, Vol. 6, 21556Article in journal (Refereed) PublishedText
Abstract [en]

We demonstrate a tool for quantitative measurements in the extreme ultraviolet (EUV) spectral region measuring spatially resolved atomic ionization products at the focus of an EUV beam. The ionizing radiation is a comb of the 11th-15th harmonics of a Ti:Sapphire femtosecond laser beam produced in a Xenon gas jet. The spatial ion distribution at the focus of the harmonics is recorded using an ion microscope. Spatially resolved single-and two-photon ionization products of Argon and Helium are observed. From such ion distributions single-and two-photon generalized cross sections can be extracted by a self-calibrating method. The observation of spatially resolved two-EUV-photon ionization constitutes an initial step towards future single-shot temporal characterization of attosecond pulses.

Place, publisher, year, edition, pages
2016. Vol. 6, 21556
National Category
Atom and Molecular Physics and Optics
URN: urn:nbn:se:umu:diva-117816DOI: 10.1038/srep21556ISI: 000369934900001OAI: diva2:917926
Available from: 2016-04-08 Created: 2016-03-04 Last updated: 2016-04-08Bibliographically approved

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Veisz, László
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