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Cross-sectional scanning tunneling microscopy investigations of InGaSb/GaAs/GaP(001) nanostructures
KTH, School of Engineering Sciences (SCI), Applied Physics.
2015 (English)Independent thesis Advanced level (degree of Master (Two Years)), 20 credits / 30 HE creditsStudent thesis
Place, publisher, year, edition, pages
2015.
Series
TRITA-FYS, ISSN 0280-316X ; 2015:83
National Category
Physical Sciences
Identifiers
URN: urn:nbn:se:kth:diva-177995OAI: oai:DiVA.org:kth-177995DiVA: diva2:875265
Available from: 2015-12-01 Created: 2015-12-01 Last updated: 2015-12-01Bibliographically approved

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Type fulltextMimetype application/pdf

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CiteExportLink to record
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  • apa
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