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Characterization of gold nanoparticle films: Rutherford backscatteringspectroscopy, scanning electron microscopy with image analysis, and atomic forcemicroscopy
Uppsala University, Disciplinary Domain of Science and Technology, Technology, Department of Engineering Sciences, Solid State Physics.
Royal Institute of Technology, Stockholm.
Uppsala University, Disciplinary Domain of Science and Technology, Technology, Department of Engineering Sciences, Solid State Physics.ORCID iD: 0000-0002-8279-5163
Uppsala University, Disciplinary Domain of Science and Technology, Technology, Department of Engineering Sciences, Solid State Physics.
2014 (English)In: AIP Advances, ISSN 2158-3226, E-ISSN 2158-3226, Vol. 4, no 10, 107101- p.Article in journal (Refereed) Published
Abstract [en]

Gold nanoparticle films are of interest in several branches of science and technology,and accurate sample characterization is needed but technically demanding. We preparedsuch films by DC magnetron sputtering and recorded their mass thicknessby Rutherford backscattering spectroscopy. The geometric thickness dg—from thesubstrate to the tops of the nanoparticles—was obtained by scanning electron microscopy(SEM) combined with image analysis as well as by atomic force microscopy(AFM). The various techniques yielded an internally consistent characterization ofthe films. In particular, very similar results for dg were obtained by SEM with imageanalysis and by AFM.

Place, publisher, year, edition, pages
2014. Vol. 4, no 10, 107101- p.
National Category
Nano Technology
Research subject
Engineering Science with specialization in Solid State Physics
Identifiers
URN: urn:nbn:se:uu:diva-233494DOI: 10.1063/1.4897340ISI: 000344588200002OAI: oai:DiVA.org:uu-233494DiVA: diva2:752865
Projects
EU GRINDOOR
Funder
EU, FP7, Seventh Framework Programme, 267234
Available from: 2014-10-06 Created: 2014-10-06 Last updated: 2017-12-05Bibliographically approved

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Lansåker, Pia CHallén, AndersNiklasson, Gunnar AGranqvist, Claes-Göran
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