Improvement in the Reliability of a Bi-Processing Unit Satellite Subject to Radiation-Induced Bit-Flips
The design of reliable spacecrafts is a challenging task because of the harsh
constraints imposed by the outer space environment. One major cause of
failure of part or totality of the system lies in the space radiations which
affect the embedded electronic components, such as the introduction of
bit-flips in the memory devices.
The work accomplished in this thesis attempts to improve the reliability
of NUTS (NTNU - Test Satellite). The focus has been set on the research
of software techniques leveraging the hardware architecture available in
order to achieve tolerance against radiation-induced bit-flips.
A study of the effect of bit-flips in both data and program memory has
led to the establishment of a stack of techniques aiming at increasing
the reliability of the system in a radiated environment. These techniques
consist of the use of watchdogs, the corruption detection and correction
of the program memory, the recourse of a JTAG channel to reprogram a
deficient processing unit, and the takeover of the whole system by one
processing unit in the event of a permanent failure of the second one.
Each technique has been thoroughly tested individually in the presence of
bit-flip injection. Additionally, a test of the whole protective stack showed
very positive results since the system has been able to run successfully
for more than 8 hours sustaining a bit-flip density 250 times higher than
the expected on-orbit rate.
Place, publisher, year, edition, pages
Institutt for elektronikk og telekommunikasjon , 2014. , 110 p.
IdentifiersURN: urn:nbn:no:ntnu:diva-26483Local ID: ntnudaim:11553OAI: oai:DiVA.org:ntnu-26483DiVA: diva2:747984
Larsen, Bjørn B., Førsteamanuensis