State-of-the-art within jitter measurement
Independent thesis Advanced level (degree of Master (Two Years)), 20 credits / 30 HE creditsStudent thesis
The aim of this thesis is to study different types of jitter measurement methods and to make comparison between them. With this purpose, a literature study was performed by searching in different databases.
The explored databases include: a) Recent research articles in jitter measurements appearing in IEEE xplorer with published date posterior to 1998, b) Application notes and white papers from leading companies as Agilent and Anritsu.
In this study it is shown that the research method presented in  has more accuracy compared to ITU standard method due to that an specific signal from PDH is measured directly while no specification to test equipment is need it. In case of the measurement of aperture uncertainty on ADC it is shown that the research method in  has more accuracy compare to IEEE standard methods because it removes quantization error and amplitude noise from measurement while does not need any frequency information
Place, publisher, year, edition, pages
2014. , 50 p.
Engineering and Technology
IdentifiersURN: urn:nbn:se:hig:diva-16148OAI: oai:DiVA.org:hig-16148DiVA: diva2:690508
Subject / course
Electronics/Telecommunications – master’s programme (two years) (swe or eng)
högskolan Gävle, gävle (English)