Non-contact method for measurement of the microwave conductivity of graphene
2013 (English)In: Applied Physics Letters, ISSN 0003-6951, E-ISSN 1077-3118, Vol. 103, no 12Article in journal (Refereed) Published
We report a non-contact method for conductivity and sheet resistance measurements of monolayer and few layers graphene samples using a high Q microwave dielectric resonator perturbation technique, with the aim of fast and accurate measurement. The dynamic range of the microwave conductivity measurements makes this technique sensitive to a range of imperfections and impurities and can provide rapid non-contacting characterisation. As a demonstration of the power of the technique, we present results for graphene samples grown by three different methods with widely differing sheet resistance values.
Place, publisher, year, edition, pages
American Institute of Physics (AIP) , 2013. Vol. 103, no 12
Engineering and Technology
IdentifiersURN: urn:nbn:se:liu:diva-100317DOI: 10.1063/1.4821268ISI: 000324826000055OAI: oai:DiVA.org:liu-100317DiVA: diva2:661478
Funding Agencies|UK NMS Programme||EU EMRP Project MetNEMS|NEW-08|EU FP7 Project Concept Graphene||EMRP||EURAMET||European Union||2013-11-042013-11-042013-12-28