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Utökade tester enligt IEEE std 1149.1-2001 för Main Switch Board
Linköping University, Department of Science and Technology. Linköping University, The Institute of Technology.
2005 (Swedish)Independent thesis Advanced level (degree of Master (Two Years)), 20 credits / 30 HE creditsStudent thesisAlternative title
Extended board test according to IEEE std 1149.1 for Main Switch Board (English)
Abstract [sv]

Kravet på detta examensarbete var att utveckla tester för en produkt i prototypstadiet hos Ericsson i Katrineholm. Dessa tester ska framförallt användas som verktyg vid felsökning och utvecklas på kretskortsnivå. Detta innebär test för att hitta processrelaterade fel som t.ex. felaktiga lödningar. Arbetet började med att studera den tekniska bakgrunden. Sedan gjordes en testbarhetsanalys för att undersöka brister i tänkta tester och andra möjligheter till att få en bra feltäckning och felutpekning. Därefter utvecklas ett antal tester. Metoden som har används är uteslutande boundary-scan enligt IEEE standarden 1149.1-2001 genom verktyget Asset InterTech, Inc ScanWorks 3.4.

Resultatet av arbetet innefattar framförallt minnestester för SDRAM och flash men också spänningskontroller och vanliga förbindelsetest. Dessa tester har också dokumenterats enligt Ericssons krav.

Abstract [en]

The requirements of this bachelor thesis was to develop board tests for a prototype at Ericsson in Katrineholm. These tests should above all be used to locate faults. In this case, board test is synonymous with verifying the manufacturing process.

The work began by studying the technical background. Then a testability review was done to investigate possible lacks in planned tests and other opportunities to get a better fault coverage. Thereafter a number of tests were developed. The method used is entirely boundary-scan according to IEEE standard 1149.1-2001 together with the software tool ScanWorks 3.4 by Asset InterTech, Inc.

The result includes above all memory tests for SDRAM and flash but also voltage control and ordinary interconnection tests. These results have been documented according to Ericsson’s requirements.

Place, publisher, year, edition, pages
2005. , 54 p.
National Category
Engineering and Technology
Identifiers
URN: urn:nbn:se:liu:diva-97916ISRN: LITH-ITN-EX--05/019--SEOAI: oai:DiVA.org:liu-97916DiVA: diva2:653493
Subject / course
Computer Engineering
Supervisors
Examiners
Available from: 2013-10-04 Created: 2013-09-23 Last updated: 2013-10-04Bibliographically approved

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CiteExportLink to record
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  • apa
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