Effect of charged line defects on conductivity in graphene: Numerical Kubo and analytical Boltzmann approaches
2013 (English)In: Physical Review B. Condensed Matter and Materials Physics, ISSN 1098-0121, E-ISSN 1550-235X, Vol. 87, no 19, 195448- p.Article in journal (Refereed) Published
Charge carrier transport in single-layer graphene with one-dimensional charged defects is studied theoretically. Extended charged defects, considered an important factor for mobility degradation in chemically vapor-deposited graphene, are described by a self-consistent Thomas-Fermi potential. A numerical study of electronic transport is performed by means of a time-dependent real-space Kubo approach in honeycomb lattices containing millions of carbon atoms, capturing the linear response of realistic size systems in the highly disordered regime. Our numerical calculations are complemented with a kinetic transport theory describing charge transport in the weak scattering limit. The semiclassical transport lifetimes are obtained by computing scattered amplitudes within the second Born approximation. The transport electron-hole asymmetry found in the semiclassical approach is consistent with the Kubo calculations. In the strong scattering regime, the conductivity is found to be a sublinear function of electronic density and weakly dependent on the Thomas-Fermi screening wavelength. We attribute this atypical behavior to the extended nature of one-dimensional charged defects. Our results are consistent with recent experimental reports.
Place, publisher, year, edition, pages
American Physical Society , 2013. Vol. 87, no 19, 195448- p.
Engineering and Technology
IdentifiersURN: urn:nbn:se:liu:diva-96132DOI: 10.1103/PhysRevB.87.195448ISI: 000319802900006OAI: oai:DiVA.org:liu-96132DiVA: diva2:640753