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Large-area microfocal spectroscopic ellipsometry mapping of thickness and electronic properties of epitaxial graphene on Si- and C-face of 3C-SiC(111)
Linköping University, Department of Physics, Chemistry and Biology, Semiconductor Materials. Linköping University, The Institute of Technology.
Department of Engineering, University of Nebraska-Lincoln, Lincoln, Nebraska, USA.
Lund University, Maxlab, Lund, Sweden.
Department of Engineering, University of Nebraska-Lincoln, Lincoln, Nebraska, USA.
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2013 (English)In: Applied Physics Letters, ISSN 0003-6951, E-ISSN 1077-3118, Vol. 102, no 21, 213116- p.Article in journal (Refereed) Published
Abstract [en]

Microfocal spectroscopic ellipsometry mapping of the electronic properties and thickness of epitaxial graphene grown by high-temperature sublimation on 3C-SiC (111) substrates is reported. Growth of one monolayer graphene is demonstrated on both Si- and C-polarity of the 3C-SiC substrates and it is shown that large area homogeneous single monolayer graphene can be achieved on the Si-face substrates. Correlations between the number of graphene monolayers on one hand and the main transition associated with an exciton enhanced van Hove singularity at ∼4.5 eV and the free-charge carrier scattering time, on the other are established. It is shown that the interface structure on the Si- and C-polarity of the 3C-SiC(111) differs and has a determining role for the thickness and electronic properties homogeneity of the epitaxial graphene.

Place, publisher, year, edition, pages
American Institute of Physics (AIP) , 2013. Vol. 102, no 21, 213116- p.
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Engineering and Technology
URN: urn:nbn:se:liu:diva-96134DOI: 10.1063/1.4808379ISI: 000320620400073OAI: diva2:640750
Available from: 2013-08-14 Created: 2013-08-14 Last updated: 2013-10-02

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Darakchieva, VanyaIakimov, TihomirVasiliauskas, RemigijusYakimova, Rositsa
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