Time-domain and energetic bombardment effects on the nucleation and coalescence of thin metal films on amorphous substrates
2013 (English)In: Journal of Physics D: Applied Physics, ISSN 0022-3727, E-ISSN 1361-6463, Vol. 46, no 21Article in journal (Refereed) Published
Pulsed, ionized vapour fluxes, generated from high power impulse magnetron sputtering (HiPIMS) discharges, are employed to study the effects of time-domain and energetic bombardment on the nucleation and coalescence characteristics during Volmer–Weber growth of metal (Ag) films on amorphous (SiO2) substrates. In situ monitoring of the film growth, by means of wafer curvature measurements and spectroscopic ellipsometry, is used to determine the film thickness where a continuous film is formed. This thickness decreases from ~210 to ~140 Å when increasing the pulsing frequency for a constant amount of material deposited per pulse or when increasing the amount of material deposited per pulse and the energy of the film forming species for a constant pulsing frequency. Estimations of adatom lifetimes and the coalescence times show that there are conditions at which these times are within the range of the modulation of the vapour flux. Thus, nucleation and coalescence processes can be manipulated by changing the temporal profile of the vapour flux. We suggest that other than for elucidating the atomistic mechanisms that control pulsed growth processes, the interplay between the time scales for diffusion, coalescence and vapour flux pulsing can be used as a tool to determine characteristic surface diffusion and island coalescence parameters.
Place, publisher, year, edition, pages
Institute of Physics: Hybrid Open Access , 2013. Vol. 46, no 21
Engineering and Technology
IdentifiersURN: urn:nbn:se:liu:diva-95508DOI: 10.1088/0022-3727/46/21/215303ISI: 000319116300009OAI: oai:DiVA.org:liu-95508DiVA: diva2:635742
Funding Agencies|Swedish Research Council|VR 621-2011-4280|COST Action Highly Ionized Pulsed Plasmas|MP0804|Linkoping University via the LiU Research Fellows program||2013-07-052013-07-052014-08-27Bibliographically approved