Investigation of charge collection in a CdTe-Timepix detector
2013 (English)In: Journal of Instrumentation, ISSN 1748-0221, E-ISSN 1748-0221, Vol. 8, no May, Art. no. C05003- p.Article in journal (Refereed) Published
Energy calibration of CdTe detectors is usually done using known reference sources disregarding the exact amount of charge that is collected in the pixels. However, to compare detector and detector model the quantity of charge collected is needed. We characterize the charge collection in a CdTe detector comparing test pulses, measured data and an improved TCAD simulation model . The 1 mm thick detector is bump-bonded to a TIMEPIX chip and operating in Time-over-Threshold (ToT) mode. The resistivity in the simulation was adjusted to match the detector properties setting a deep intrinsic donor level . This way it is possible to adjust properties like trap concentration, electron/hole lifetime and mobility in the simulation characterizing the detector close to measured data cite .
Place, publisher, year, edition, pages
2013. Vol. 8, no May, Art. no. C05003- p.
Charge induction; solid state detectors; x-ray detectors; models and simulations
Condensed Matter Physics
IdentifiersURN: urn:nbn:se:miun:diva-18946DOI: 10.1088/1748-0221/8/05/C05003ISI: 000320726000003ScopusID: 2-s2.0-84878342633Local ID: STCOAI: oai:DiVA.org:miun-18946DiVA: diva2:621728
14th International Workshop on Radiation Imaging Detectors (iWoRID 2012); 20-25 June 2012; Figueira da Foz, Portugal.