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Unit Testing and Analysis Using a Stored Reference Signal
KTH, School of Electrical Engineering (EES), Signal Processing.ORCID iD: 0000-0002-4265-9490
2014 (English)Patent (Other (popular science, discussion, etc.))
Abstract [en]

Method and system for a test process. The method may include performing tests on one or more units under test (UUTs). At least one test on one or more UUTs may be performed. A signal may be acquired from the UUT. A reference signal may be retrieved. The reference signal may be derived from a transmitted signal characteristic of the UUT. The signal may be analyzed with respect to the reference signal. Results, useable to characterize the one or more UUTs, from performing the at least one test on the one or more UUTs may be stored. The reference signal may be derived from an initial test and may be stored for subsequent retrieval. A respective reference signal may be retrieved for all UUTs of the one or more UUTs for a respective test. The signal may be a radio frequency signal. The UUT may be a wireless mobile device. 

Place, publisher, year, edition, pages
2014.
National Category
Electrical Engineering, Electronic Engineering, Information Engineering Signal Processing
Identifiers
URN: urn:nbn:se:kth:diva-120149OAI: oai:DiVA.org:kth-120149DiVA: diva2:613711
Patent
US 20140040668A1
Note

QS 2015

Available from: 2013-04-01 Created: 2013-04-01 Last updated: 2015-04-09Bibliographically approved

Open Access in DiVA

fulltext(1205 kB)25 downloads
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CiteExportLink to record
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Citation style
  • apa
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Output format
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