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Graphical User Interface for Intermodulation Atomic Force Microscopyok.
KTH, School of Engineering Sciences (SCI), Applied Physics.
KTH, School of Technology and Health (STH). KTH, School of Engineering Sciences (SCI), Applied Physics.
KTH, School of Engineering Sciences (SCI), Applied Physics.
2011 (English)Independent thesis Basic level (degree of Bachelor), 10 credits / 15 HE creditsStudent thesis
Abstract [en]

In atomic force microscopy (AFM) a cantilever, with a sharp tip attached

to its free end, is scanned over a surface. Forces from the surface aect

the tip causing cantilever deection, which is registered by a detector. This

information is then used to create a topographical image of the surface on

nanoscale. We were a part of a project that developed a new type of AFM,

namely intermodulation atomic force microscopy (IMAFM). It is based on

dynamic AFM, but instead of one drive frequency, two or more frequencies

are used. This generates more information from the sample. Our part in this

project was to improve the software already in use. This will facilitate future

simulations and experiments; and also utilize the available information in a

new way.

Abstract [sv]

Vid atomic force microscopy (AFM) fors en skarp spets, placerad pa den

fria anden av en kantilever, over en yta. Krafterna fran ytan pa spetsen

orsakar avvikelser i kantileverns beteende, vilket registreras av en detektor.

Denna information utnyttjas sedan for att skapa en topogrask bild av ytan

i nanoskala. Vi var involverarde i ett projekt dar det utvecklas en ny typ

av AFM, intermodulation atomic force microscopy (IMAFM). Denna grundar

sig pa dynamisk AFM, men istallet for en drivfrekvens utnyttjas tva

eller era. Vilket i sin tur genererar mer information fran samma matning.

Var uppgift i projektet var att utveckla mjukvaran som anvands vid experimenten.

Detta for att underlatta framtida experiment samt utnyttja den

tillgangliga informationen pa ett nytt satt.

Place, publisher, year, edition, pages
National Category
Engineering and Technology
URN: urn:nbn:se:kth:diva-105518OAI: diva2:571303
Physics, Chemistry, Mathematics
Available from: 2012-11-22 Created: 2012-11-22 Last updated: 2012-11-22Bibliographically approved

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