Automated Self-Test of an Analog Delta-Sigma Modulator
This project investigates the feasibility of automating the test of ΔΣ-modulators using circuit
components available on 8-bit microcontrollers, and by doing so reducing test costs.
A Built-In-Self-Test (BIST) scheme, using a binary stream as stimuli and two different
solutions for signal analysis is suggested and simulated in SPICE to investigate its suitability.
The test can not lead to a large area increase, increasing area leads to an increase in
production cost. The test has to reduce testing time. The extra area occupied by the test
architecture has to be paid in shorter testing time and therefore a lower unit price. The test has
to remove or lower the requirements of the off-chip tester, and by doing so reducing cost.
The proposed BIST requires a very small area and is capable of calculating offset, gain and
Signal to Noise Ratio with a high degree of accuracy. The proposed solution enables on-chip
testing without the need for expensive external stimuli and signal analyzers, making testing on
wafer possible thus improving production yield.
The proposed test will not reduce test time by itself, however by integrating the test on-chip
and allowing this to run in the background while other on-chip modules are tested total test
time can be reduced to the time required to shift the stimuli into the chip
Place, publisher, year, edition, pages
Institutt for elektronikk og telekommunikasjon , 2007. , 125 p.
ntnudaim:3586, MTEL elektronikk, Krets- og systemkonstruksjon
IdentifiersURN: urn:nbn:no:ntnu:diva-16752Local ID: ntnudaim:3586OAI: oai:DiVA.org:ntnu-16752DiVA: diva2:536431
Sæther, Trond, ProfessorHellandsvik, Are