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Automated Self-Test of an Analog Delta-Sigma Modulator
Norwegian University of Science and Technology, Faculty of Information Technology, Mathematics and Electrical Engineering, Department of Electronics and Telecommunications.
2007 (English)MasteroppgaveStudent thesis
Abstract [en]

This project investigates the feasibility of automating the test of ΔΣ-modulators using circuit components available on 8-bit microcontrollers, and by doing so reducing test costs. A Built-In-Self-Test (BIST) scheme, using a binary stream as stimuli and two different solutions for signal analysis is suggested and simulated in SPICE to investigate its suitability. The test can not lead to a large area increase, increasing area leads to an increase in production cost. The test has to reduce testing time. The extra area occupied by the test architecture has to be paid in shorter testing time and therefore a lower unit price. The test has to remove or lower the requirements of the off-chip tester, and by doing so reducing cost. The proposed BIST requires a very small area and is capable of calculating offset, gain and Signal to Noise Ratio with a high degree of accuracy. The proposed solution enables on-chip testing without the need for expensive external stimuli and signal analyzers, making testing on wafer possible thus improving production yield. The proposed test will not reduce test time by itself, however by integrating the test on-chip and allowing this to run in the background while other on-chip modules are tested total test time can be reduced to the time required to shift the stimuli into the chip

Place, publisher, year, edition, pages
Institutt for elektronikk og telekommunikasjon , 2007. , 125 p.
Keyword [no]
ntnudaim:3586, MTEL elektronikk, Krets- og systemkonstruksjon
URN: urn:nbn:no:ntnu:diva-16752Local ID: ntnudaim:3586OAI: diva2:536431
Available from: 2012-06-21 Created: 2012-06-21

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