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Scheduling Tests for 3D Stacked Chips under Power Constraints
Linköping University, Department of Computer and Information Science, ESLAB - Embedded Systems Laboratory. Linköping University, The Institute of Technology.
Linköping University, Department of Computer and Information Science, ESLAB - Embedded Systems Laboratory. Linköping University, The Institute of Technology.
Linköping University, Department of Computer and Information Science, ESLAB - Embedded Systems Laboratory. Linköping University, The Institute of Technology.
2012 (English)In: Journal of electronic testing, ISSN 0923-8174, E-ISSN 1573-0727, Vol. 28, no 1, 121-135 p.Article in journal (Refereed) Published
Abstract [en]

This paper addresses Test Application Time (TAT) reduction under power constraints for core-based 3D Stacked ICs (SICs) connected by Through Silicon Vias (TSVs). Unlike non-stacked chips, where the test flow is well defined by applying the same test schedule both at wafer sort and at package test, the test flow for 3D TSV-SICs is yet undefined. In this paper we present a cost model to find the optimal test flow. For the optimal test flow, we propose test scheduling algorithms that take the particulars of 3D TSV-SICs into account. A key challenge in testing 3D TSV-SICs is to reduce the TAT by co-optimizing the wafer sort and the package test while meeting power constraints. We consider a system of chips with cores that are accessed through an on-chip JTAG infrastructure and propose a test scheduling approach to reduce TAT while considering resource conflicts and meeting the power constraints. Depending on the test schedule, the JTAG interconnect lines that are required can be shared to test several cores. This is taken into account in experiments with an implementation of the proposed scheduling approach. The results show significant savings in TAT.

Place, publisher, year, edition, pages
Springer Verlag (Germany) , 2012. Vol. 28, no 1, 121-135 p.
Keyword [en]
Power constrained test scheduling, 3D integration
National Category
Engineering and Technology
Identifiers
URN: urn:nbn:se:liu:diva-77342DOI: 10.1007/s10836-011-5244-5ISI: 000302868800011OAI: oai:DiVA.org:liu-77342DiVA: diva2:526312
Note
Funding Agencies|Swedish Research Council||Available from: 2012-05-11 Created: 2012-05-11 Last updated: 2017-12-07

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