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LabView Based Measurement System Design for Data Acquisition During HTOL Tests at TranSIC AB
KTH, School of Electrical Engineering (EES), Microsystem Technology.
2011 (English)Independent thesis Advanced level (professional degree), 20 credits / 30 HE creditsStudent thesis
Abstract [en]

TranSIC AB needs to conduct High Temperature Operating Life (HTOL) tests on silicon carbide transistors in order to ensure product reliability and gather information for development purposes. The goal of this master thesis was to select measurement related hardware and develop LabView software capable of controlling and monitoring up to 48 transistors during HTOL tests. National Instruments cDAQ and Agilent 34972A were compared for data acquisition purposes. Calculations and hardware requirements resulted in the purchase and system integration of a Agilent 34972A data logger with three 34901A 20 channel multiplexer expansion cards. LabView software was programmed using a extended Producer/Consumer Design Pattern as the main structure. Software requirements was fulfilled using SubVIs for both user visible windows and functionality related data handling. The finished software fulfilled all initial requirements but several possible future improvements are suggested. The system is now in full scale use at TranSIC AB.

Place, publisher, year, edition, pages
2011. , 67 p.
Series
EES Examensarbete / Master Thesis, XR-EE-MST 2011:009
National Category
Engineering and Technology
Identifiers
URN: urn:nbn:se:kth:diva-91733OAI: oai:DiVA.org:kth-91733DiVA: diva2:511152
Uppsok
Technology
Examiners
Available from: 2012-03-20 Created: 2012-03-20 Last updated: 2012-03-20Bibliographically approved

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CiteExportLink to record
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Citation style
  • apa
  • ieee
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  • de-DE
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Output format
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