Optical and Electrical Characterization at the Nanoscale by a Transparent Tip of a Scanning Tunneling Microscope
2009 (English)In: Nanotechnology, ISSN 0957-4484, E-ISSN 1361-6528, Vol. 20, no 14, 145706- p.Article in journal (Refereed) Published
A new type of scanning probe microscope, combining features of the scanning tunnelling microscope, the scanning tunnelling luminescence microscope with a transparent probe and the aperture scanning near-field optical microscope, is described. Proof-of-concept experiments were performed under ultrahigh vacuum conditions at varying temperature on GaAs/AlAs heterostructures.
Place, publisher, year, edition, pages
Institute of Physics Publishing (IOPP), 2009. Vol. 20, no 14, 145706- p.
luminescence, near-field, STM, STML, SNOM
Atom and Molecular Physics and Optics
IdentifiersURN: urn:nbn:se:kth:diva-48934DOI: 10.1088/0957-4484/20/14/145706ISI: 000264539500021OAI: oai:DiVA.org:kth-48934DiVA: diva2:458878
QC 201111292012-01-272011-11-242012-01-27Bibliographically approved