Study of protein adsorption on structured surfaces using ellipsometry
Independent thesis Basic level (degree of Bachelor), 10 credits / 15 HE creditsStudent thesis
In order to measure the thickness of a protein layer on a structured surface of silicon rubber, we have used ellipsometry and Fourier transform infrared (FTIR)-spectroscopy. The aim was to determine whether this type of measurement method can be used on protein layers or not. By hot-embossing a specific pattern of micrometre-sized pillars was created on the surface of the silicon rubber, which then was exposed to a phosphate buffer solution (PBS) containing human serum albumin (HSA) protein. FTIR measurements confirmed that proteins had attached to the surface. Ellipsometric studies were made and even though the protein layer was too thin to be measured, a simulation was made that revealed that a protein layer needs to be at least 1,5 nm to be measured properly with this method. We can also see that the protein molecules can get out of the solution, to find their way into the small pits of the samples.
Place, publisher, year, edition, pages
2011. , 37 p.
Ellipsometry, FTIR-spectroscopy, protein adsorption, hydrophobicity
IdentifiersURN: urn:nbn:se:liu:diva-72165ISRN: LITH-IFM-G-EX--11/2526--SEOAI: oai:DiVA.org:liu-72165DiVA: diva2:457757
Subject / course
UppsokPhysics, Chemistry, Mathematics
Hallberg, TomasSavage, StevenBerlind, Torun