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IR optical properties in thin films of diamond
Uppsala University, Disciplinary Domain of Science and Technology, Technology, Department of Engineering Sciences.
2011 (English)Independent thesis Advanced level (professional degree), 20 credits / 30 HE creditsStudent thesis
Abstract [en]

In the past decades new interest in diamond and possible applications of diamond has emerged. In this master thesis, optical properties of thin films of diamond were investigated for the possible use as an Internal Reflection Element (IRE) in Attenuated Total Reflection Fourier Infra Red (ATR-FTIR) spectroscopy. First a theoretical study of optical properties was made using Fresnel’s equations. Secondly the ray-tracing software TracePro was tested as a possible tool for further investigations of optical properties in advanced geometries. Finally, experimental measurements were made to compare the simulated result with measured data. Results obtained with TracePro were consistent with the theoretically expected results as to dependence of layer thickness, polarization and wavelength, and TracePro was therefore a possible tool for the investigation of optical properties in thin films. Although no extra information was given from TracePro for this specific geometry, TracePro can be a valuable tool in the investigation of more advanced geometries. The experimental measurements showed the importance of a well-defined layer thickness and also showed a stronger dependence of the underlying coating materials than expected from simulations. Further investigations need to be made to fully understand the dependence of the underlying coating materials SiO2 and Si3N4, particularly regarding different polarization states.

Place, publisher, year, edition, pages
2011. , 50 p.
Series
UPTEC F, ISSN 1401-5757 ; 11 056
Keyword [en]
diamond, thin films
National Category
Engineering and Technology
Identifiers
URN: urn:nbn:se:uu:diva-160592OAI: oai:DiVA.org:uu-160592DiVA: diva2:451682
Educational program
Master Programme in Engineering Physics
Uppsok
Technology
Supervisors
Examiners
Available from: 2011-10-27 Created: 2011-10-26 Last updated: 2011-10-27Bibliographically approved

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CiteExportLink to record
Permanent link

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Cite
Citation style
  • apa
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Other style
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  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
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  • Other locale
More languages
Output format
  • html
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