Interface core-level shifts as a probe of embedded thin-film quality
2011 (English)In: Physical Review B. Condensed Matter and Materials Physics, ISSN 1098-0121, E-ISSN 1550-235X, Vol. 84, no 8, 085431- p.Article in journal (Refereed) Published
We use first-principles calculations of layer-resolved core-level binding energy shifts (CLSs) within density functional theory as away to characterize the interface quality and thickness in embedded thin-film nanomaterials. A closer study of interfaces is motivated as properties specific to nanostructures can be related directly to the interface environment or indirectly as interference effects due to quantum confinement. From an analysis based on the Cu 2p(3/2) CLS for Cu embedded in Ni and Co fcc (100) and Fe bcc (100), with the interfaces represented by intermixing profiles controlled by a single parameter, we evaluate layer-resolved shifts as a probe of the thin-film quality. The core-level shifts in the corresponding disordered alloys, as well as local environment effects, are studied for comparison. We also discuss the possibility of detecting interface states by means of core-level shift measurements.
Place, publisher, year, edition, pages
American Physical Society , 2011. Vol. 84, no 8, 085431- p.
Engineering and Technology
IdentifiersURN: urn:nbn:se:liu:diva-70748DOI: 10.1103/PhysRevB.84.085431ISI: 000294325400015OAI: oai:DiVA.org:liu-70748DiVA: diva2:441462