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Characterization of Solar Cell Wafers with Low Coherence Interferometry
Norwegian University of Science and Technology, Faculty of Information Technology, Mathematics and Electrical Engineering, Department of Electronics and Telecommunications.
2011 (English)MasteroppgaveStudent thesis
Abstract [en]
Characterize silicon wafers used in solar cell production with a NIR-LCI interferometer. The interferometer is further developed and measurements on silicon samples are carried out.
Place, publisher, year, edition, pages
Institutt for elektronikk og telekommunikasjon , 2011. , 122 p.
Keyword [no]
ntnudaim:6303, MTEL elektronikk, Nanoelektronikk og mikrosystemer
URN: urn:nbn:no:ntnu:diva-13430Local ID: ntnudaim:6303OAI: diva2:438445
Available from: 2011-09-02 Created: 2011-09-02

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