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To automatically estimate the surface area coverage of carbon nanotubes on thin film transistors with image analysis: Bachelor’s degree project report
Uppsala University, Disciplinary Domain of Science and Technology, Technology, Department of Engineering Sciences.
2011 (English)Independent thesis Basic level (degree of Bachelor), 10 credits / 15 HE creditsStudent thesis
Abstract [en]

This report discuss the developement of a MATLAB-based tool for the analysis ofsurface area coverage of carbon nanotube networks from atomic force microscopyimages. The tool was compared with a manual method and the conclusion was that ithas, at least, the same accuracy as the manual mehtod, and it needs much less time forthe analysis. The tool couldn’t analyze images of carbon nanotube networks if theimages were to noisy or the networks to dense. The tool can help in the research ofthin-film transistors with carbon nanotube networks as the semiconducting channelmaterial.

Place, publisher, year, edition, pages
2011. , 17 p.
Series
TVE, 11031
Keyword [en]
image analysis, thin film transistor, TFT, carbon nanotube, CNT
National Category
Other Engineering and Technologies
Identifiers
URN: urn:nbn:se:uu:diva-157168OAI: oai:DiVA.org:uu-157168DiVA: diva2:435387
Educational program
Master Programme in Engineering Physics
Uppsok
Technology
Supervisors
Examiners
Available from: 2011-10-07 Created: 2011-08-18 Last updated: 2011-10-07Bibliographically approved

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CiteExportLink to record
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Citation style
  • apa
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Output format
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