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Detecting magnetic ordering with atomic size electron probes
Oak Ridge Natl Lab, Ctr Nanophase Mat Sci, Oak Ridge, TN 37831 USA.ORCID iD: 0000-0001-7483-9034
Uppsala University, Disciplinary Domain of Science and Technology, Physics, Department of Physics and Astronomy, Materials Theory.ORCID iD: 0000-0002-0074-1349
Uppsala University, Disciplinary Domain of Science and Technology, Physics, Department of Physics and Astronomy, Materials Theory.ORCID iD: 0000-0002-6550-0087
Oak Ridge Natl Lab, Mat Sci & Technol Div, Oak Ridge, TN 37831 USA.
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2016 (English)In: ADVANCED STRUCTURAL AND CHEMICAL IMAGING, ISSN 2198-0926, Vol. 2, article id 5Article in journal (Refereed) Published
Abstract [en]

Although magnetism originates at the atomic scale, the existing spectroscopic techniques sensitive to magnetic signals only produce spectra with spatial resolution on a larger scale. However, recently, it has been theoretically argued that atomic size electron probes with customized phase distributions can detect magnetic circular dichroism. Here, we report a direct experimental real-space detection of magnetic circular dichroism in aberration-corrected scanning transmission electron microscopy (STEM). Using an atomic size-aberrated electron probe with a customized phase distribution, we reveal the checkerboard antiferromagnetic ordering of Mn moments in LaMnAsO by observing a dichroic signal in the Mn L-edge. The novel experimental setup presented here, which can easily be implemented in aberration-corrected STEM, opens new paths for probing dichroic signals in materials with unprecedented spatial resolution.

Place, publisher, year, edition, pages
SPRINGER HEIDELBERG , 2016. Vol. 2, article id 5
Keywords [en]
Aberration correction, STEM, EELS, EMCD, Aberrated probes, Vortex beams
National Category
Condensed Matter Physics
Identifiers
URN: urn:nbn:se:uu:diva-400797DOI: 10.1186/s40679-016-0019-9ISI: 000411085200001OAI: oai:DiVA.org:uu-400797DiVA, id: diva2:1382602
Funder
Swedish Research CouncilSwedish National Infrastructure for Computing (SNIC)Available from: 2020-01-03 Created: 2020-01-03 Last updated: 2020-01-03Bibliographically approved

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