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Implementation of low-energy PIXE at the new scattering chamber of the 350 kV implanter
Uppsala University, Disciplinary Domain of Science and Technology, Physics, Department of Physics and Astronomy, Applied Nuclear Physics. (Ion Physics Group)
2019 (English)Independent thesis Advanced level (degree of Master (One Year)), 10 HE creditsStudent thesis
Abstract [en]

In this work, a new setup for low-energy Particles Induced X-Ray emission (LE-PIXE) was developed at the third beamline of the 350 kV implanter.  First, we implemented a new X-Ray detector in the chamber. Then, we compared the method with other X-ray based techniques such as, X-ray Fluorescence (XRF), Energy Dispersive X-Ray Spectroscopy (EDX) and high-energy PIXE . An analysis of the strengths and weakness of each technique will be given. To complete the experimental work, an important theory part is provided to introduce the main phenomena taking place during the experiments, covering from the main theory of the ionization of atoms to the cross section and attenuation principle for PIXE and RBS.  Likewise an analysis of the limitation and of the possibility of low-energy PIXE through the detection limits measured on Fluorine and Oxygen samples will be carried out. The major goal is to be able to make a new statements on low-energy PIXE method following new theoretical models and better equipment.

Place, publisher, year, edition, pages
2019. , p. 31
Series
FYSAST ; FYSPROJ1131
National Category
Engineering and Technology
Identifiers
URN: urn:nbn:se:uu:diva-388853OAI: oai:DiVA.org:uu-388853DiVA, id: diva2:1335665
Educational program
Freestanding course
Presentation
2019-06-05, Angstrom laboratory, Uppsala, 19:43 (English)
Supervisors
Examiners
Available from: 2019-07-10 Created: 2019-07-05 Last updated: 2019-07-10Bibliographically approved

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CiteExportLink to record
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