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Remote Tracking of Phase Changes in Cr2AlC Thin Films by In-situ Resistivity Measurements
Rhein Westfal TH Aachen, Mat Chem, D-52074 Aachen, Germany.ORCID iD: 0000-0002-7727-1488
Rhein Westfal TH Aachen, Mat Chem, D-52074 Aachen, Germany.
Rhein Westfal TH Aachen, Mat Chem, D-52074 Aachen, Germany.
Rhein Westfal TH Aachen, Mat Chem, D-52074 Aachen, Germany.ORCID iD: 0000-0002-1814-3101
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2019 (English)In: Scientific Reports, ISSN 2045-2322, E-ISSN 2045-2322, Vol. 9, article id 8266Article in journal (Refereed) Published
Abstract [en]

Resistivity changes of magnetron sputtered, amorphous Cr2AlC thin films were measured during heating in vacuum. Based on correlative X-ray diffraction, in-situ and ex-situ selected area electron diffraction measurements and differential scanning calorimetry data from literature it is evident that the resistivity changes at 552 +/- 4 and 585 +/- 13 degrees C indicate the phase transitions from amorphous to a hexagonal disordered solid solution structure and from the latter to MAX phase, respectively. We have shown that phase changes in Cr2AlC thin films can be revealed by in-situ measurements of thermally induced resistivity changes.

Place, publisher, year, edition, pages
NATURE PUBLISHING GROUP , 2019. Vol. 9, article id 8266
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Inorganic Chemistry Materials Chemistry
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URN: urn:nbn:se:uu:diva-387731DOI: 10.1038/s41598-019-44692-4ISI: 000470075600015PubMedID: 31164687OAI: oai:DiVA.org:uu-387731DiVA, id: diva2:1330366
Funder
Swedish Research Council, 821-2012-5144Swedish Foundation for Strategic Research , RIF14-0053Available from: 2019-06-25 Created: 2019-06-25 Last updated: 2019-06-25Bibliographically approved

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