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On the Reliability of LTE Random Access: Performance Bounds for Machine-to-Machine Burst Resolution Time
KTH, School of Electrical Engineering (EES), Information Science and Engineering.
KTH.
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2018 (English)Conference paper, Published paper (Refereed)
Place, publisher, year, edition, pages
2018.
National Category
Engineering and Technology
Research subject
Electrical Engineering
Identifiers
URN: urn:nbn:se:kth:diva-223419OAI: oai:DiVA.org:kth-223419DiVA, id: diva2:1184299
Conference
IEEE International Conference on Communications 2018 (ICC 2018) 20 May - 24 May 2018, Kansas City, MO, USA
Note

QC 20180327

Available from: 2018-02-21 Created: 2018-02-21 Last updated: 2018-03-27Bibliographically approved

Open Access in DiVA

fulltext(508 kB)11 downloads
File information
File name FULLTEXT01.pdfFile size 508 kBChecksum SHA-512
c8e57cb9d5acac00f0bb5b5fe971ed040c3ec429e6a4e9e13dd08985161a9bf9e5abd50636eeae9b4ff8fab56ebf83b737d41a374a7954d50628a161bdddbcde
Type fulltextMimetype application/pdf

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Schiessl, SebastianAl Zubaidy, HusseinGross, James
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CiteExportLink to record
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Citation style
  • apa
  • ieee
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  • vancouver
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Language
  • de-DE
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Output format
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