Change search
CiteExportLink to record
Permanent link

Direct link
Cite
Citation style
  • apa
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf
Using weekly open defect reports as anindicator for software process efficiency : Theoretical framework and a longitudinal automotive industrial case study
RISE - Research Institutes of Sweden, ICT, Viktoria.
2017 (English)In: Proceedings of IWSM/Mensura'17, October 25–27, 2017, Gothenburg, Sweden (MENSURA’17), 2017Conference paper, Published paper (Refereed)
Abstract [en]

Well-defined, informative and cheap indicators are important inany software development organization that needs to evaluateaspects of its development processes and product quality. This isespecially true for large organizations and for organizationsdeveloping complex products; for example automotive safetyfunctions where mechanical, electronic and software systemsneed to interact. In this paper we describe defect backlog profilesas a well-defined, cheap and informative indicator. We definedefect backlog profiles in terms of ISO/IEC 15939, provide atheoretical framework for interpretation, and finally present anevaluation in which we applied the indicator in a longitudinalcase study at an automotive manufacturer. In the case study, wecompare the software integration defect backlog profile for theactive safety component released in 2010 to the profile for thefollowing generation of the same component released in 2015.The results are then linked to a number of process and productchanges that occurred between the two product generations. Weconclude that defect backlog profiles are cheap in terms of datacollection and analysis, and can provide valuable process andproduct quality information although with limitations.

Place, publisher, year, edition, pages
2017.
Keyword [en]
defect backlog profile, indicators, ISO/IEC15939, time-to-market
National Category
Computer and Information Sciences
Identifiers
URN: urn:nbn:se:ri:diva-33093DOI: 10.1145/3143434.3143463OAI: oai:DiVA.org:ri-33093DiVA, id: diva2:1174559
Conference
IWSM/Mensura '17, October 25–27, 2017, Gothenburg, Sweden (MENSURA’17)
Available from: 2018-01-16 Created: 2018-01-16 Last updated: 2018-01-16Bibliographically approved

Open Access in DiVA

fulltext(441 kB)285 downloads
File information
File name FULLTEXT01.pdfFile size 441 kBChecksum SHA-512
46f18ac185344ef6aa8c86766d4aab11a30017c4087247baefc9e00ccebac3b6794a5b5c302ba582065692315dcf14947e5af46126d0fadafd3c973a62d6c86b
Type fulltextMimetype application/pdf

Other links

Publisher's full text
By organisation
Viktoria
Computer and Information Sciences

Search outside of DiVA

GoogleGoogle Scholar
Total: 285 downloads
The number of downloads is the sum of all downloads of full texts. It may include eg previous versions that are now no longer available

doi
urn-nbn

Altmetric score

doi
urn-nbn
Total: 4 hits
CiteExportLink to record
Permanent link

Direct link
Cite
Citation style
  • apa
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf
v. 2.34-SNAPSHOT
|