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Gas rarefaction effects during high power pulsed magnetron sputtering of groups IVb and VIb transition metals in Ar
Linköping University, Department of Physics, Chemistry and Biology, Thin Film Physics. Linköping University, Faculty of Science & Engineering.ORCID iD: 0000-0002-4898-5115
Linköping University, Department of Physics, Chemistry and Biology, Thin Film Physics. Linköping University, Faculty of Science & Engineering.
Linköping University, Department of Physics, Chemistry and Biology, Thin Film Physics. Linköping University, Faculty of Science & Engineering. University of Illinois, IL 61801 USA; University of Illinois, IL 61801 USA.
Linköping University, Department of Physics, Chemistry and Biology, Thin Film Physics. Linköping University, Faculty of Science & Engineering. University of Illinois, IL 61801 USA; University of Illinois, IL 61801 USA; University of Illinois, IL 61801 USA.
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2017 (English)In: Journal of Vacuum Science & Technology. A. Vacuum, Surfaces, and Films, ISSN 0734-2101, E-ISSN 1520-8559, Vol. 35, no 6, article id 060601Article in journal (Refereed) Published
Abstract [en]

The authors use energy- and time-dependent mass spectrometry to analyze the evolution of metal- and gas-ion fluxes incident at the substrate during high-power pulsed magnetron sputtering (HiPIMS) of groups IVb and VIb transition-metal (TM) targets in Ar. For all TMs, the time-and energy-integrated metal/gas-ion ratio at the substrate plane NMe+/NAr+ increases with increasing peak target current density J(T,peak) due to rarefaction. In addition, NMe+/NAr+ exhibits a strong dependence on metal/gas-atom mass ratio m(Me)/m(g) and varies from similar to 1 for Ti (m(Ti)/m(Ar) = 1.20) to similar to 100 for W (m(W)/m(Ar) = 4.60), with J(T,peak) maintained constant at 1 A/cm(2). Time-resolved ion-energy distribution functions confirm that the degree of rarefaction scales with m(Me)/m(g): for heavier TMs, the original sputtered-atom Sigmund-Thompson energy distributions are preserved long after the HiPIMS pulse, which is in distinct contrast to lighter metals for which the energy distributions collapse into a narrow thermalized peak. Hence, precise timing of synchronous substrate-bias pulses, applied in order to reduce film stress while increasing densification, is critical for metal/gas combinations with m(Me)/m(g) near unity, while with m(Me)/m(g) amp;gt;amp;gt; 1, the width of the synchronous bias pulse is essentially controlled by the metal-ion time of flight. The good agreement between results obtained in an industrial system employing 440 cm(2) cathodes and a laboratory-scale system with a 20 cm(2) target is indicative of the fundamental nature of the phenomena. 

Place, publisher, year, edition, pages
American Institute of Physics (AIP), 2017. Vol. 35, no 6, article id 060601
Keyword [en]
Time of flight mass spectrometry, Metalloids, Wave mechanics, Physical vapor deposition, Semiconductor device fabrication
National Category
Condensed Matter Physics
Identifiers
URN: urn:nbn:se:liu:diva-143365DOI: 10.1116/1.4989674ISI: 000415685300001Scopus ID: 2-s2.0-85024128172OAI: oai:DiVA.org:liu-143365DiVA, id: diva2:1162790
Note

Funding Agencies|Swedish Research Council VR [2014-5790]; Aforsk Foundation [16-359]; Swedish Government Strategic Research Area in Materials Science on Functional Materials at Linkoping University [2009 00971]; Knut and Alice Wallenberg Foundation [KAW 2015.0043]

Available from: 2017-12-05 Created: 2017-12-05 Last updated: 2018-01-10Bibliographically approved

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Greczynski, GrzegorzZhirkov, IgorPetrov, IvanGreene, Joseph ERosén, Johanna
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