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Single-shot Monitoring of Ultrafast Processes via X-ray Streaking at a Free Electron Laser
Paul Scherrer Inst, CH-5232 Villigen, Switzerland..
Paul Scherrer Inst, CH-5232 Villigen, Switzerland..
Paul Scherrer Inst, CH-5232 Villigen, Switzerland..
Paul Scherrer Inst, CH-5232 Villigen, Switzerland..
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2017 (English)In: Scientific Reports, ISSN 2045-2322, E-ISSN 2045-2322, Vol. 7, article id 7253Article in journal (Refereed) Published
Abstract [en]

The advent of x-ray free electron lasers has extended the unique capabilities of resonant x-ray spectroscopy techniques to ultrafast time scales. Here, we report on a novel experimental method that allows retrieving with a single x-ray pulse the time evolution of an ultrafast process, not only at a few discrete time delays, but continuously over an extended time window. We used a single x-ray pulse to resolve the laser-induced ultrafast demagnetisation dynamics in a thin cobalt film over a time window of about 1.6 ps with an excellent signal to noise ratio. From one representative single shot measurement we extract a spin relaxation time of (130 +/- 30) fs with an average value, based on 193 single shot events of (113 +/- 20) fs. These results are limited by the achieved experimental time resolution of 120 fs, and both values are in excellent agreement with previous results and theoretical modelling. More generally, this new experimental approach to ultrafast x-ray spectroscopy paves the way to the study of non-repetitive processes that cannot be investigated using traditional repetitive pump-probe schemes.

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Nature Publishing Group, 2017. Vol. 7, article id 7253
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Physical Sciences
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URN: urn:nbn:se:uu:diva-334049DOI: 10.1038/s41598-017-07069-zISI: 000406889500082OAI: oai:DiVA.org:uu-334049DiVA, id: diva2:1158608
Available from: 2017-11-20 Created: 2017-11-20 Last updated: 2017-11-20Bibliographically approved

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