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Performance evaluation of a micro screen printing installation
KTH, School of Industrial Engineering and Management (ITM), Production Engineering. (Manufacturing and Metrology systems)ORCID iD: 0000-0001-5214-5736
KTH, School of Industrial Engineering and Management (ITM), Production Engineering. (Manufacturing and Metrology systems)
2017 (English)Report (Other academic)
Abstract [en]

Micro- and nano-manufacturing is an expanding industry and many different manufacturing techniques are used, from advanced focused ion beam treatment to reasonably simple printing technologies. Common to all of them are the needs to verify the manufactured geometries and dimensions. This report presents the results of the second round of benchmarking activities within the EUMINAfab European Research Infrastructure, in order to establish more knowledge about the capabilities of a screen printing installation. To obtain a better understanding of the accuracy of the screen printing installation, a precise verification test is needed to measure the absolute performance of the machine. Predicted performance and capability information is based on specifications given for the machine installation by the machine deliverer. But, in practice the absolute performances of the installation is often off from the specification. When forming the EUMINAfab infrastructure consortium it was decided that independent high precision verification tests should be made on different installations to help the micro-manufacturers to get the real capability information of their equipment and be able to improve performance to a higher EUMINAfab level. In this study a comprehensive verification test was designed and carried out by using an ultra-precision metrology method in order to establish more knowledge about the capabilities of the screen printing equipment. The measurement results show the machine’s X,Y position accuracy, pseudo-repeatability and reproducibility. It is not as good as predicted.

Place, publisher, year, edition, pages
2017. , 9 p.
Series
TRITA-IIP, ISSN 1650-1888
National Category
Engineering and Technology
Identifiers
URN: urn:nbn:se:kth:diva-207591OAI: oai:DiVA.org:kth-207591DiVA: diva2:1097159
Note

QC 20170523

Available from: 2017-05-22 Created: 2017-05-22 Last updated: 2017-05-23Bibliographically approved
In thesis
1. Enhanced image analysis, a tool for precision metrology in the micro and macro world
Open this publication in new window or tab >>Enhanced image analysis, a tool for precision metrology in the micro and macro world
2017 (English)Doctoral thesis, comprehensive summary (Other academic)
Abstract [en]

The need for high speed and cost efficient inspection in manufacturing lineshas led to a vast usage of camera-based vision systems. The performance ofthese systems is sufficient to determine shape and size, but hardly to an accuracylevel comparable with traditional metrology tools. To achieve highprecision shape/position/defect measurements, the camera techniques haveto be combined with high performance image metrology techniques whichare developed and adapted to the manufactured components. The focus ofthis thesis is the application of enhanced image analysis as a tool for highprecision metrology. Dedicated algorithms have been developed, tested andevaluated in three practical cases ranging from micro manufacturing at submicronprecision to meter sized aerospace components with precision requirementsin the 10 μm range.The latter measurement challenge was solved by low cost standard consumerproducts, i.e. digital cameras in a stereo configuration and structured lightfrom a gobo-projector. Combined with high-precision image analysis and anew approach in camera calibration and 3D reconstruction for precise 3Dshape measurement of meter sized surfaces, the achievement was fulfilledand verified by two conventional measurement systems; a high precisioncoordinate measurement machine and a laser scanner.The sub-micron challenge was the implementation of image metrology forverification of micro manufacturing installations within a joint Europeaninfrastructure network, EUMINAfab. The results were an unpleasant surprisefor some of the participating laboratories, but became a big step forwardto improve the dimensional accuracy of the investigated laser micromachining, micro milling and micro-printing systems, since the accuracy ofthese techniques are very difficult to assess.The third high precision metrology challenge was the measurement of longrange,low-amplitude topographic structures on specular (shiny) aerodynamicsurfaces. In this case Fringe Reflection Technique (FRT) was appliedand image analysis algorithms were used to evaluate the fringe deformationas a measure of the surface slopes to obtain high resolution data. The resultwas compared with an interferometric analysis showing height deviation inthe range of tens of micrometers over a lateral extension of several cm.

Place, publisher, year, edition, pages
KTH Royal Institute of Technology, 2017. 120 p.
Series
TRITA-IIP, ISSN 1650-1888 ; TRITA IIP-17-05
Keyword
Image processing, image metrology, precision metrology, image correlation, subpixel, accuracy, uncertainty
National Category
Engineering and Technology
Research subject
Production Engineering
Identifiers
urn:nbn:se:kth:diva-207594 (URN)978-91-7729-392-7 (ISBN)
Public defence
2017-06-15, M311, Brinellvägen 68, Stockholm, 10:00 (English)
Opponent
Supervisors
Projects
LOCOMACHSEUMINAfabCleansky
Note

QC 20170523

Available from: 2017-05-23 Created: 2017-05-22 Last updated: 2017-05-23Bibliographically approved

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