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Distance-Integrated Combinatorial Testing
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2016 (English)In: 27th IEEE Int. Symposium on Software Reliability Engineering (ISSRE 2016), IEEE conference proceedings, 2016, p. 93-104Conference paper, Published paper (Refereed)
Abstract [en]

This paper proposes a novel approach to combinatorial test generation, which achieves an increase of not only the number of new combinations but also the distance between test cases. We applied our distance-integrated approach to a state-of-the-art greedy algorithm for traditional combinatorial test generation by using two distance metrics, Hamming distance, and a modified chi-square distance. Experimental results using numerous benchmark models show that combinatorial test suites generated by our approach using both distance metrics can improve interaction coverage for higher interaction strengths with low computational overhead.

Place, publisher, year, edition, pages
IEEE conference proceedings, 2016. p. 93-104
Keywords [en]
Combinatorial testing; t-way test generation; t-way coverage; Interaction strength; Hamming distance; Chi-square distance.
National Category
Computer Sciences
Identifiers
URN: urn:nbn:se:kth:diva-199092DOI: 10.1109/ISSRE.2016.26ISI: 000391437700010Scopus ID: 2-s2.0-85013278782OAI: oai:DiVA.org:kth-199092DiVA, id: diva2:1062023
Conference
27th IEEE Int. Symposium on Software Reliability Engineering (ISSRE 2016)
Note

QC 20170109

Available from: 2017-01-04 Created: 2016-12-28 Last updated: 2018-01-13Bibliographically approved

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fulltext(649 kB)51 downloads
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Type fulltextMimetype application/pdf

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Publisher's full textScopushttp://ieeexplore.ieee.org/document/7774511/

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CiteExportLink to record
Permanent link

Direct link
Cite
Citation style
  • apa
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf