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Flaw detection in layered media based on parametric modeling of overlapping ultrasonic echoes
Luleå University of Technology, Department of Computer Science, Electrical and Space Engineering, Signals and Systems.ORCID iD: 0000-0002-6216-6132
2006 (English)In: Proceedings: 2006 IEEE Ultrasonics Symposium : Vancouver, Canada, 3 - 6 October 2006, Piscataway, NJ: IEEE Communications Society, 2006, 136-139 p.Conference paper, Published paper (Refereed)
Abstract [en]

In materials consisting of several thin layers, multiple reflections within the structure give rise to received ultrasonic signals composed of overlapping echoes. In this paper we present a parametric model that can be used to decompose such signals into the individual reflections. We derive a Maximum Likelihood Estimator for the the model parameters, which are then used in a Generalized Likelihood Ratio Test (GLRT) to detect flaws in multi-layered structures. We show with simulations how the presence of a thin bonding layer in a three-layer structure can be detected. The probability of detection is shown to be ≈ 96%, for a signal-to-noise ratio (SNR) of 15 dB and a probability of false alarm of 5%.

Place, publisher, year, edition, pages
Piscataway, NJ: IEEE Communications Society, 2006. 136-139 p.
Series
I E E E International Ultrasonics Symposium. Proceedings, ISSN 1051-0117
National Category
Signal Processing
Research subject
Signal Processing
Identifiers
URN: urn:nbn:se:ltu:diva-40658DOI: 10.1109/ULTSYM.2006.47Scopus ID: 47249163344Local ID: fdb6f140-b5b3-11db-bf94-000ea68e967bISBN: 1-4244-0201-8 (print)OAI: oai:DiVA.org:ltu-40658DiVA: diva2:1014179
Conference
IEEE Ultrasonics Symposium : 03/10/2006 - 06/10/2006
Note
Validerad; 2006; 20061114 (ysko)Available from: 2016-10-03 Created: 2016-10-03 Last updated: 2017-11-25Bibliographically approved

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CiteExportLink to record
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