Residual stress evolution during decomposition of Ti(1-x)Al(x)N coatings using high-energy X-rays
2006 (English)In: Residual stresses VII: ECRS 7 ; proceedings of the 7th European Conference on Residual Stresses, Trans Tech Publications Inc., 2006, 619-624 p.Conference paper (Refereed)
Residual stresses and microstructural changes during phase separation in Ti33Al67N coatings were examined using microfocused high energy x-rays from a synchrotron source. The transmission geometry allowed simultaneous acquisition of x-ray diffraction data over 360° and revealed that the decomposition at elevated temperatures occurred anisotropically, initiating preferentially along the film plane. The as-deposited compressive residual stress in the film plane first relaxed with annealing, before dramatically increasing concurrently with the initial stage of phase separation where metastable, nm-scale c-AlN platelets precipitated along the film direction. These findings were further supported from SAXS analyses.
Place, publisher, year, edition, pages
Trans Tech Publications Inc., 2006. 619-624 p.
, Materials Science Forum, ISSN 0255-5476 ; 524-525
Research subject Engineering Materials
IdentifiersURN: urn:nbn:se:ltu:diva-34707DOI: 10.4028/www.scientific.net/MSF.524-525.619Local ID: 8fb26600-e78d-11db-8a98-000ea68e967bISBN: 0-87849-414-6OAI: oai:DiVA.org:ltu-34707DiVA: diva2:1007958
European Conference on Residual Stresses : 13/09/2006 - 15/09/2006
Validerad; 2006; 20070410 (ysko)2016-09-302016-09-30Bibliographically approved