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Residual stress evolution during decomposition of Ti(1-x)Al(x)N coatings using high-energy X-rays
Advanced Photon Source (APS), Argonne National Laboratory, Argonne.
Advanced Photon Source (APS), Argonne National Laboratory, Argonne.
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2006 (English)In: Residual stresses VII: ECRS 7 ; proceedings of the 7th European Conference on Residual Stresses, Trans Tech Publications Inc., 2006, 619-624 p.Conference paper, Published paper (Refereed)
Abstract [en]

Residual stresses and microstructural changes during phase separation in Ti33Al67N coatings were examined using microfocused high energy x-rays from a synchrotron source. The transmission geometry allowed simultaneous acquisition of x-ray diffraction data over 360° and revealed that the decomposition at elevated temperatures occurred anisotropically, initiating preferentially along the film plane. The as-deposited compressive residual stress in the film plane first relaxed with annealing, before dramatically increasing concurrently with the initial stage of phase separation where metastable, nm-scale c-AlN platelets precipitated along the film direction. These findings were further supported from SAXS analyses.

Place, publisher, year, edition, pages
Trans Tech Publications Inc., 2006. 619-624 p.
Series
Materials Science Forum, ISSN 0255-5476 ; 524-525
National Category
Other Materials Engineering
Research subject
Engineering Materials
Identifiers
URN: urn:nbn:se:ltu:diva-34707DOI: 10.4028/www.scientific.net/MSF.524-525.619Local ID: 8fb26600-e78d-11db-8a98-000ea68e967bISBN: 0-87849-414-6 (print)OAI: oai:DiVA.org:ltu-34707DiVA: diva2:1007958
Conference
European Conference on Residual Stresses : 13/09/2006 - 15/09/2006
Note
Validerad; 2006; 20070410 (ysko)Available from: 2016-09-30 Created: 2016-09-30 Last updated: 2017-11-25Bibliographically approved

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Publisher's full texthttp://www.scientific.net/0-87849-414-6/619/

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