"Detect" - a new defect detection method and its use on sheet moulding compound (SMC) substrates
2008 (English)In: Composites for sustainable progress: ECCM 13, 13th European Conference on Composite Materials ; June 2 - 5, 2008, Stockholm, Sweden, Stockholm, 2008Conference paper (Refereed)
A novel optical method for detection of surface porosities on SMC substrates is presented. Detection is facilitated by observation of how a liquid film on the surface evaporates. The method utilizes the fact that complete evaporation takes longer time in the pores than elsewhere. The rate of change of a laser speckle pattern gives a measure of the changes at the surface and indicates where pores causes prolonged evaporation. A pilot measurement unit was built that shows that the principle ideas of the system work. Attempts were made to develop the pilot unit so that it could provide quantitative numbers of actual defects on an SMC substrate. The results are encouraging in the sense that the unit can automatically identify areas with higher number of defects.
Place, publisher, year, edition, pages
Research subject Experimental Mechanics
IdentifiersURN: urn:nbn:se:ltu:diva-31268Local ID: 5657b620-c54f-11dd-80bd-000ea68e967bOAI: oai:DiVA.org:ltu-31268DiVA: diva2:1004501
European Conference on Composite Materials : 02/06/2008 - 05/06/2008
Godkänd; 2008; Bibliografisk uppgift: USB; 20081208 (ysko)2016-09-302016-09-30Bibliographically approved