On characterizing artifacts observed in PEEC based modeling
2004 (English)In: EMC 2004: E2004 IEEE International Symposium on Electromagnetic Compatibility : EMC from DC to daylight : [symposium record] : 09 August-13 [sic], 2004, Silicon Valley, California, Piscataway, NJ: IEEE Communications Society, 2004, 251-255 p.Conference paper (Refereed)
This paper characterizes the different artifacts observed within time- and frequency- domain partial element equivalent circuit based electromagnetic modeling. The main focus is on frequency domain artifacts since time domain instabilities have been treated extensively in the literature. Guidelines and examples are given on how to suppress this type of artifact by showing correlation to PEEC model geometrical meshing and PEEC model complexity reduction.
Place, publisher, year, edition, pages
Piscataway, NJ: IEEE Communications Society, 2004. 251-255 p.
Research subject Industrial Electronics
IdentifiersURN: urn:nbn:se:ltu:diva-29617DOI: 10.1109/ISEMC.2004.1350035Local ID: 32816f70-6cdc-11db-83c6-000ea68e967bISBN: 0-7803-8443-1OAI: oai:DiVA.org:ltu-29617DiVA: diva2:1002841
IEEE International Symposium on Electromagnetic Compatibility : 09/08/2004 - 13/08/2004
Godkänd; 2004; 20060929 (ysko)2016-09-302016-09-30Bibliographically approved