Endre søk
RefereraExporteraLink to record
Permanent link

Direct link
Referera
Referensformat
  • apa
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Annet format
Fler format
Språk
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Annet språk
Fler språk
Utmatningsformat
  • html
  • text
  • asciidoc
  • rtf
Repeatability analysis of two methods for height measurements in the micrometer range
Manufacturing Engineering Centre, Cardiff University, Cardiff CF24 3AA, UK.
Manufacturing Engineering Centre, Cardiff University, Cardiff CF24 3AA, UK.
Manufacturing Engineering Centre, Cardiff University, Cardiff CF24 3AA, UK.
KTH, Skolan för industriell teknik och management (ITM), Industriell produktion, Mätteknik och optik.ORCID-id: 0000-0002-0105-4102
2006 (engelsk)Inngår i: 4M 2006 Second International Conference on Multi-Material Micro Manufacture / [ed] Wolfgang Menz, Stefan Dimov and Bertrand Fillon, Amsterdam: Elsevier, 2006, s. 165-168Konferansepaper, Publicerat paper (Fagfellevurdert)
Abstract [en]

A precision study of two height measuring methods is carried out. The first method is based on a White Light Interferometer (WLI) and the second on a Co-ordinate Measuring Machine (CMM) equipped with an optical probe. The height measurements considered are in the range [150; 250] μm. Point and interval estimates of repeatability are reported in the paper. This study presents experimental evidence that, under repeatability conditions, the precision of the WLI method is about five times higher than that of the optical CMM method. Furthermore, the precision of WLI is constant over the investigated height range whereas a dependency of the CMM precision on the nominal dimensions is identified. For both methods a linear relationship is detected between the random error and the sequence in which the measurements are taken.

sted, utgiver, år, opplag, sider
Amsterdam: Elsevier, 2006. s. 165-168
Emneord [en]
Repeatability, White light interferometry, CMM, Micro metrology
HSV kategori
Forskningsprogram
SRA - Produktion
Identifikatorer
URN: urn:nbn:se:kth:diva-78537ISBN: 978-0-08-045263-9 (tryckt)ISBN: 0-08-045263-0 (tryckt)OAI: oai:DiVA.org:kth-78537DiVA, id: diva2:492630
Konferanse
4M 2006, 20-22 Sept, Grenoble, France
Prosjekter
4M Multi Material Micro Manufacture Network of Excellence
Forskningsfinansiär
XPRES - Initiative for excellence in production research
Merknad
QC 20120220Tilgjengelig fra: 2012-02-08 Laget: 2012-02-08 Sist oppdatert: 2012-02-20bibliografisk kontrollert

Open Access i DiVA

Fulltekst mangler i DiVA

Søk i DiVA

Av forfatter/redaktør
Mattsson, Lars
Av organisasjonen

Søk utenfor DiVA

GoogleGoogle Scholar

isbn
urn-nbn

Altmetric

isbn
urn-nbn
Totalt: 268 treff
RefereraExporteraLink to record
Permanent link

Direct link
Referera
Referensformat
  • apa
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Annet format
Fler format
Språk
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Annet språk
Fler språk
Utmatningsformat
  • html
  • text
  • asciidoc
  • rtf