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AFM-based manipulation of InAs nanowires
Högskolan i Halmstad, Sektionen för Informationsvetenskap, Data– och Elektroteknik (IDE), Halmstad Embedded and Intelligent Systems Research (EIS), Tillämpad matematik och fysik (MPE-lab). (Nanovetenskap)
Avd. f. Fasta tillståndets fysik, Lunds Universitet. (Nanometerkonsortiet)
Institute for Theoretical Physics, Leipzig University.
Avd. f. Fasta tillståndets fysik, Lunds Universitet. (Nanometerkonsortiet)
Vise andre og tillknytning
2008 (engelsk)Inngår i: Proceedings of the IVC-17 (17th International Vacuum Congress) [also] ICSS-13 (13th International Conference on Surface Science) [also] ICN+T-2007 (International Conference on Nanoscience and Technology): 2-6 July 2007, Stockholm, Sweden, Bristol: Institute of Physics (IOP), 2008, Vol. 100, nr 5, 1, s. 052051-052051-4Konferansepaper, Publicerat paper (Fagfellevurdert)
Abstract [en]

A controlled method of manipulation of nanowires was found using the tip of an Atomic Force Microscope (AFM). Manipulation is done in the ‘Retrace Lift’ mode, where feedback is turned off for the reverse scan and the tip follows a nominal path. The effective manipulation force during the reverse scan can be changed by varying an offset in the height of the tip over the surface. Using this method, we have studied InAs nanowires on different substrates. We have also investigated interactions between wires and with gold features patterned onto the substrates.

sted, utgiver, år, opplag, sider
Bristol: Institute of Physics (IOP), 2008. Vol. 100, nr 5, 1, s. 052051-052051-4
Serie
Journal of Physics: Conference Series, ISSN 1742-6588 ; Volume 100, Part 5
Emneord [en]
AFM, Atomic force microscopes, Different substrates, InAs, Method of manipulation, Nanowires, Semiconducting indium
HSV kategori
Identifikatorer
URN: urn:nbn:se:hh:diva-16454DOI: 10.1088/1742-6596/100/5/052051ISI: 000275655200147Scopus ID: 2-s2.0-77954338849OAI: oai:DiVA.org:hh-16454DiVA, id: diva2:448304
Konferanse
17th International Vacuum Congress/13th International Conference on Surface Science/Internatinal Conference on Nanoscience and Technology, 2-6 July 2007, Stockholm, Sweden
Tilgjengelig fra: 2011-10-15 Laget: 2011-10-15 Sist oppdatert: 2018-04-03bibliografisk kontrollert

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