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Investigation of Fabrication Accuracy and Repeatability of High-Q Silicon-Micromachined Narrowband Sub-THz Waveguide Filters
KTH, School of Electrical Engineering and Computer Science (EECS), Micro and Nanosystems.ORCID iD: 0000-0002-7033-2452
KTH, School of Electrical Engineering and Computer Science (EECS), Micro and Nanosystems.
KTH, School of Electrical Engineering and Computer Science (EECS), Micro and Nanosystems.ORCID iD: 0000-0002-8514-6863
KTH, School of Electrical Engineering and Computer Science (EECS), Micro and Nanosystems.ORCID iD: 0000-0001-5662-6748
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2019 (English)In: IEEE transactions on microwave theory and techniques, ISSN 0018-9480, E-ISSN 1557-9670, Vol. 67, no 9, p. 3696-3706Article in journal (Refereed) Published
Abstract [en]

This paper investigates the fabrication accuracy and repeatability of micromachined quadruplet filters designed at a center frequency of 270 GHz with a 5-GHz bandwidth using a versatile multilayer chip platform which allows for axially arranged waveguide ports. A large number of narrowband silicon-micromachined filters arranged on multiple chips are investigated for fabrication imperfections, assembly misalignment, and fabrication yield, employing fabrication-prediction and different chip-to-chip self-alignment feature strategies. A numerical technique for characterization of the entire fabrication process of the filters through extracting the error statistics for coupling coefficients of a large number of different samples from separately assembled chips is proposed. A total of 47 test filters in effectively 15 different design variants have been fabricated in two fabrication runs, evaluated, and analyzed. The most critical sources of errors are determined. The expected accuracy of the entire filters fabrication process is demonstrated through the yield analysis based on the collected error statistics.

Place, publisher, year, edition, pages
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC , 2019. Vol. 67, no 9, p. 3696-3706
Keywords [en]
Coupling matrices, dual-mode filters, microfabrication, micromachining technology, waveguide filters, yield analysis
National Category
Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
URN: urn:nbn:se:kth:diva-262976DOI: 10.1109/TMTT.2019.2926244ISI: 000489766500018OAI: oai:DiVA.org:kth-262976DiVA, id: diva2:1367046
Note

QC 20191031

Available from: 2019-10-31 Created: 2019-10-31 Last updated: 2019-10-31Bibliographically approved

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Glubokov, OleksandrXinghai, ZhaoCampion, JamesBeuerle, BernhardShah, UmerOberhammer, Joachim
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