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Testing aware dynamic mapping for path-centric network-on-chip test
University of Electronic Science and Technology of China, Chengdu, China.
University of Electronic Science and Technology of China, Chengdu, China.
University of Electronic Science and Technology of China, Chengdu, China.
University of Electronic Science and Technology of China, Chengdu, China.
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2019 (English)In: Integration, ISSN 0167-9260, E-ISSN 1872-7522, Vol. 67, p. 134-143Article in journal (Refereed) Published
Abstract [en]

With the aggressive scaling of submicron technology, intermittent faults are becoming one of the limiting factors in achieving high reliability in Network-on-Chip (NoC). Increasing test frequency is necessary to detect intermittent faults, which in turn interrupts the execution of applications. On the other hand, the primary goal of traditional mapping algorithms is to allocate applications to the NoC platform, ignoring the test requirement. In this paper, we propose a novel testing-aware mapping algorithm (TAMA) for NoC, targeting intermittent faults on the paths between crossbars. In this approach, the idle paths are identified, and the components between two crossbars are tested when the application is mapped to the platform. The components can be tested if there is enough time from the time when the application leaves the platform to the time when a new application enters it. The mapping algorithm is tuned to give a higher priority to the tested paths in the next application mapping, which leaves enough time to test the links and the belonging components that have not been tested in the expected time. Experiment results show that the proposed testing-aware mapping algorithm leads to a significant improvement over FF(Fiexitrst Free), NN(Nearest Neighbor), CoNA(Contiguous Neighborhood Allocation), and WeNA(Weighted-based Neighborhood Allocation).

Place, publisher, year, edition, pages
Elsevier, 2019. Vol. 67, p. 134-143
Keywords [en]
Network-on-Chip, Mapping algorithm, Intermittent fault, On-line testing
National Category
Embedded Systems Other Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
URN: urn:nbn:se:kth:diva-254859DOI: 10.1016/j.vlsi.2018.11.009ISI: 000473839600013Scopus ID: 2-s2.0-85058048689OAI: oai:DiVA.org:kth-254859DiVA, id: diva2:1335648
Note

QC 20190710

Available from: 2019-07-05 Created: 2019-07-05 Last updated: 2019-07-29Bibliographically approved

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