Överlåtaren: a fast way to transfer and orthogonalize two-dimensional off-specular reflectivity dataShow others and affiliations
2016 (English)In: Journal of applied crystallography, ISSN 0021-8898, E-ISSN 1600-5767, Vol. 49, p. 2091-2099Article in journal (Refereed) Published
Abstract [en]
Reflectivity measurements offer unique opportunities for the study of surfaces and interfaces, and specular reflectometry has become a standard tool in materials science to resolve structures normal to the surface of a thin film. Off-specular scattering, which probes lateral structures, is more difficult to analyse, because the Fourier space being probed is highly anisotropic and the scattering pattern is truncated by the interface. As a result, scattering patterns collected with (especially time-of-flight) neutron reflectometers are difficult to transform into reciprocal space for comparison with model calculations. A program package is presented for a generic two-dimensional transformation of reflectometry data into q space and back. The data are represented on an orthogonal grid, allowing cuts along directions relevant for theoretical modelling. This treatment includes background subtraction as well as a full characterization of the resolution function. The method is optimized for computational performance using repeatable operations and standardized instrument settings.
Place, publisher, year, edition, pages
2016. Vol. 49, p. 2091-2099
Keywords [en]
off-specular scattering, neutron reflectometry, interfaces, surfaces
National Category
Atom and Molecular Physics and Optics Other Physics Topics Computational Mathematics
Identifiers
URN: urn:nbn:se:uu:diva-315086DOI: 10.1107/S1600576716014382ISI: 000391195900025OAI: oai:DiVA.org:uu-315086DiVA, id: diva2:1073217
Funder
Swedish Research Council, C0511501The Swedish Foundation for International Cooperation in Research and Higher Education (STINT), IG-2011-20672017-02-092017-02-092018-04-11Bibliographically approved
In thesis