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Deterministic Scan-Chain Diagnosis for Intermittent Faults
NXP Semiconductors corp., Eindhoven, the Netherlands.
Philips Applied Technologies, Eindhoven, the Netherlands.
Linköping University, Department of Computer and Information Science, ESLAB - Embedded Systems Laboratory. Linköping University, The Institute of Technology.
IMEC, Leuven, Belgium).
2009 (English)In: European Test Symposium (ETS 2009), Sevilla, Spain, May 25-29, 2009 (Poster)., 2009Conference paper, Published paper (Other academic)
Place, publisher, year, edition, pages
2009.
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Engineering and Technology
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URN: urn:nbn:se:liu:diva-59589OAI: oai:DiVA.org:liu-59589DiVA: diva2:352611
Available from: 2010-09-21 Created: 2010-09-21 Last updated: 2010-09-30

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CiteExportLink to record
Permanent link

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Cite
Citation style
  • apa
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
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  • Other locale
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Output format
  • html
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  • asciidoc
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